M. J. McCOLLISTER and S. M. RICHIE
University of Central Florida, Department of Electrical and Computer Engineering, Orlando, Florida 32816-2450
Presented at the 13th European Frequency and
Time Forum and
1999 IEEE International Frequency Control Symposium
Besançon, France
April 13-16, 1999
This paper presents a stand-alone version of the design verification module for a SAW design automation system. The automation system that is being developed requires a verification phase that will be used to examine S-parameter data from test devices and determine if a specific device meets design requirements. This paper includes the specification and performance data structures, methods of extracting performance data, and methods of verifying performance versus requirements. The algorithms and techniques for efficiently extracting device performance data from experimental data are presented. Techniques including Fourier and wavelet coefficient reduction for parameter extraction are included. The core of the system contains the specification and performance data structures appropriate for SAW bandpass filter devices. The specifications contain the time response constraints, frequency response magnitude and phase, and delay constraints. Performance data is extracted from measured or calculated S-parameters as a function of frequency. This data is compared with the design requirements to see if a device meets these specifications. If a device fails, the device parameters that caused the failure are identified. All performance failures can be used as a basis for design corrections. The algorithms and programs developed in this paper will be available via the Internet at http://MikeMcCollister.com/ucf/fcs1999/.
Download the Adobe Acrobat version of the paper.
Get the source code for SawVerify here.
If you have any questions or comments about this paper or SawVerify, please contact me at fcs1999@MikeMcCollister.com.

Time Gated Frequency Response of 13 Chip Uniformly Weighted Stepped Chirp code SAW Device

Daubenchies-20 Wavelet Coefficients

Smoothed, Using Only the First 32 Daubenchies-20 Wavelet Coefficients

Sample Magnitude Screen from SawVerify
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